ANOMALOUS THERMAL-EXPANSION OF SM2FE15SI2

被引：4

作者：

LIN, C

SUN, YX

LIU, ZX

JIANG, HW

LIU, ZH

机构：

[1] Department of Physics, Peking University, Beijing, 100871, P.R. China

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1992年 / 28卷 / 05期

关键词：

D O I：

10.1109/20.179646

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Crystallographic and magnetic properties of Sm2Fe17-xSix with x=0, 0.5, 1.0, 1.5, 2.0, and 2.5 have been investigated. X-ray diffraction and thermomagnetic analyses showed that all samples studied are single phase with Th2Zn17 structure. The Curie temperature increases with increasing Si content although the lattice parameters decrease. Anomalous thermal expansion of Sm2Fe15Si2 was observed below Curie temperature by high temperature x-ray diffraction experiments.

引用

页码：2844 / 2846

页数：3

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