CONTACTLESS MEASUREMENT OF CONDUCTIVITY OF METALS AND SEMICONDUCTORS AND OF PLATING THICKNESS OF SHEET CONDUCTORS

被引：0
|
作者：
OLSZEWSKI, EJ [1 ]
CORMACK, GD [1 ]
机构：
[1] CARLETON UNIV,OTTAWA K1S 5B6,ONTARIO,CANADA
来源：
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1976年 / 25卷 / 03期
关键词：
D O I：
10.1109/TIM.1976.6312343
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：186 / 190
页数：5
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