THE RELIABILITY OF ELECTRONIC SYSTEMS

被引：0
|
作者：
CLOAREC, JM
LIGERON, JC
TROUVE, JM
机构：
[1] SGTE, SGTE
来源：
ANNALES DES MINES | 1984年 / 191卷 / 04期
关键词：
D O I：
暂无
中图分类号：
TD [矿业工程];
学科分类号：
0819 ;
摘要：
The authors describe the GLOBAL program for analysis of the reliability of electronic systems. Software linked to circuit simulation permits evaluation of reliability of the components.
引用
收藏
页码：29 / 36
页数：8
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