THE RELIABILITY OF ELECTRONIC SYSTEMS

被引：0

作者：

CLOAREC, JM

LIGERON, JC

TROUVE, JM

机构：

[1] SGTE, SGTE

来源：

ANNALES DES MINES | 1984年 / 191卷 / 04期

关键词：

D O I：

暂无

中图分类号：

TD [矿业工程];

学科分类号：

0819 ;

摘要：

The authors describe the GLOBAL program for analysis of the reliability of electronic systems. Software linked to circuit simulation permits evaluation of reliability of the components.

引用

页码：29 / 36

页数：8

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