SEMICONDUCTOR CORE-LEVEL TO VALENCE-BAND MAXIMUM BINDING-ENERGY DIFFERENCES - PRECISE DETERMINATION BY X-RAY PHOTOELECTRON-SPECTROSCOPY

被引：472
|
作者：
KRAUT, EA
GRANT, RW
WALDROP, JR
KOWALCZYK, SP
机构：
来源：
PHYSICAL REVIEW B | 1983年 / 28卷 / 04期
关键词：
D O I：
10.1103/PhysRevB.28.1965
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：1965 / 1977
页数：13
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