共 50 条
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- [23] SECONDARY ION MASS-SPECTROMETRY (SIMS) PROGRESS IN CRYSTAL GROWTH AND CHARACTERIZATION OF MATERIALS, 1984, 8 (1-2): : 11 - 57
- [27] THE SPUTTERING OF MOLECULAR-IONS FROM SURFACES IN SECONDARY ION MASS-SPECTROMETRY APPLICATIONS OF SURFACE SCIENCE, 1982, 11-2 (JUL): : 196 - 201
- [29] EFFECT OF RESIDUAL OXYGEN ON FORMATION OF MOLECULAR IONS IN SECONDARY ION MASS-SPECTROMETRY APPLIED PHYSICS, 1975, 8 (04): : 361 - 362
- [30] DETERMINATION OF DIMETHYLTHALLIUM IONS BY MEANS OF SECONDARY ION MASS-SPECTROMETRY AFTER EXTRACTION FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1989, 333 (01): : 6 - 8