ION-BEAM CRYSTALLOGRAPHY OF SILICON SURFACES .4. SI(111)-(2 X-1)

被引：17

作者：

SMIT, L ^{[1
]}

TROMP, RM ^{[1
]}

VANDERVEEN, JF ^{[1
]}

机构：

[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598

来源：

关键词：

D O I：

10.1016/0039-6028(85)91063-5

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：315 / 334

页数：20

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