EXPERIMENTAL METHODS FOR DETERMINING LATCHUP PATHS IN INTEGRATED-CIRCUITS

被引：19

作者：

JOHNSTON, AH

BAZE, MP

机构：

来源：

关键词：

D O I：

10.1109/TNS.1985.4334105

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：4260 / 4265

页数：6

共 50 条

[21] SOCKETS FOR INTEGRATED-CIRCUITS
GREENFIELD, D
ELECTRONICS AND POWER, 1983, 29 (05): : 409 - 411
[22] SPYING ON INTEGRATED-CIRCUITS
ANCEAU, F
RECHERCHE, 1981, 12 (123): : 760 - 761
[23] NEW INTEGRATED-CIRCUITS
STEIN, KU
SIEMENS FORSCHUNGS-UND ENTWICKLUNGSBERICHTE-SIEMENS RESEARCH AND DEVELOPMENT REPORTS, 1979, 8 (05): : 249 - 250
[24] ENCAPSULATING INTEGRATED-CIRCUITS
WHITE, ML
BELL LABORATORIES RECORD, 1974, 52 (03): : 78 - 83
[25] TELECOMMUNICATION INTEGRATED-CIRCUITS
GOODENOUGH, F
ELECTRONIC DESIGN, 1985, 33 (01) : 198 - &
[26] PHOTONIC INTEGRATED-CIRCUITS
KOCH, TL
KOREN, U
AT&T TECHNICAL JOURNAL, 1992, 71 (01): : 63 - 74
[27] PHOTOELECTRONIC INTEGRATED-CIRCUITS
IKEGAMI, T
PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 1989, 329 (1603): : 131 - 137
[28] MICROWAVE INTEGRATED-CIRCUITS
OUVRARD, PL
PARISOT, M
GOURRIER, S
ONDE ELECTRIQUE, 1993, 73 (06): : 32 - 40
[29] MERGED INTEGRATED-CIRCUITS
MARSHALL, S
SOLID STATE TECHNOLOGY, 1976, 19 (06) : 33 - 33
[30] OPTOELECTRONIC INTEGRATED-CIRCUITS
MATSUEDA, H
TANAKA, TP
NAKAMURA, M
SEMICONDUCTORS AND SEMIMETALS, 1990, 30 : 231 - 284