APPLICATION OF CHARGED-PARTICLE ACTIVATION-ANALYSIS TO TRACE CHARACTERIZATION OF SEMICONDUCTOR-MATERIALS

被引：10
|
作者：
SCHWEIKERT, EA
MCGINLEY, JR
FRANCIS, G
SWINDLE, DL
机构：
[1] TEXAS A&M UNIV, ACTIVATION ANAL RES LAB, COLLEGE STN, TX 77843 USA
[2] TEXAS A&M UNIV, CHEM DEPT, COLLEGE STN, TX 77843 USA
来源：
JOURNAL OF RADIOANALYTICAL CHEMISTRY | 1974年 / 19卷 / 01期
关键词：
D O I：
10.1007/BF02515270
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
引用
收藏
页码：89 / 108
页数：20
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