COST-BENEFIT ANALYSIS OF A 2-UNIT COLD STANDBY SYSTEM SUBJECT TO SLOW SWITCH

被引：14

作者：

GOPALAN, MN ^{[1
]}

RADHAKRISHNAN, R ^{[1
]}

VIJAYAKUMAR, A ^{[1
]}

机构：

[1] ANNA UNIV,COLL ENGN,DEPT MATH,MADRAS 600025,INDIA

来源：

MICROELECTRONICS AND RELIABILITY | 1984年 / 24卷 / 06期

关键词：

D O I：

10.1016/0026-2714(84)90885-0

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1019 / 1021

页数：3

共 50 条

[21] SWITCH FAILURE IN A 2-UNIT STANDBY REDUNDANT SYSTEM
GUPTA, SM
JAISWAL, NK
GOEL, LR
MICROELECTRONICS AND RELIABILITY, 1983, 23 (01): : 129 - 132
[22] COST-ANALYSIS OF A 2-UNIT PRIORITY STANDBY SYSTEM WITH IMPERFECT SWITCH AND ARBITRARY DISTRIBUTIONS
GOEL, LR
GUPTA, R
MICROELECTRONICS AND RELIABILITY, 1985, 25 (01): : 65 - 69
[23] PROFIT ANALYSIS OF A 2-UNIT PRIORITY STANDBY SYSTEM SUBJECT TO DEGRADATION
GUPTA, R
BANSAL, S
INTERNATIONAL JOURNAL OF SYSTEMS SCIENCE, 1991, 22 (01) : 61 - 72
[24] COST-BENEFIT-ANALYSIS OF A ONE-SERVER 2-UNIT WARM STANDBY SYSTEM SUBJECT TO DIFFERENT INSPECTION STRATEGIES
NAIDU, RS
GOPALAN, MN
MICROELECTRONICS AND RELIABILITY, 1983, 23 (01): : 121 - 128
[25] CHE FAILURE IN A 2-UNIT STANDBY SYSTEM WITH SLOW SWITCH, REPAIR AND POST REPAIR
GOEL, LR
GUPTA, R
TYAGI, PK
MICROELECTRONICS AND RELIABILITY, 1991, 31 (2-3): : 219 - 222
[26] COST-BENEFIT-ANALYSIS OF ONE-SERVER 2-UNIT IMPERFECT SWITCH SYSTEM SUBJECT TO MULTISTAGE REPAIRS
GOPALAN, MN
WAGHMARE, SS
MICROELECTRONICS AND RELIABILITY, 1985, 25 (03): : 541 - 548
[27] STOCHASTIC-ANALYSIS OF A 2-UNIT COLD STANDBY SYSTEM SUBJECT TO MAXIMUM OPERATION AND REPAIR TIME
SINGH, SK
AGRAFIOTIS, GK
MICROELECTRONICS AND RELIABILITY, 1995, 35 (12): : 1489 - 1493
[28] PROBABILISTIC ANALYSIS OF A 2-UNIT COLD STANDBY SYSTEM WITH INSTRUCTIONS AT NEED
KUMAR, A
GUPTA, SK
TANEJA, G
MICROELECTRONICS AND RELIABILITY, 1995, 35 (05): : 829 - 832
[29] COST-BENEFIT-ANALYSIS OF A MULTICOMPONENT STANDBY SYSTEM WITH INSPECTION AND SLOW SWITCH
GUPTA, R
BAJAJ, CP
SINHA, SM
MICROELECTRONICS AND RELIABILITY, 1986, 26 (05): : 879 - 882
[30] 2-UNIT REDUNDANT SYSTEM WITH SLOW SWITCH
SINHA, SM
KAPIL, DVS
IEEE TRANSACTIONS ON RELIABILITY, 1979, 28 (05) : 418 - 418

← 1 2 3 4 5 →