INTERPRETATION OF GHOST LINES IN SECONDARY-ELECTRON SPECTRA DETERMINED BY XPS

被引：1

作者：

GURKER, N ^{[1
]}

EBEL, H ^{[1
]}

ZEINER, K ^{[1
]}

WECHSELBERGER, K ^{[1
]}

FINSTER, J ^{[1
]}

LEONHARD, G ^{[1
]}

机构：

[1] KARL MARX UNIV,SEKT CHEM,DDR-701 LEIPZIG,GER DEM REP

来源：

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 1982年 / 25卷 / 2-3期

关键词：

D O I：

10.1016/0368-2048(82)85019-6

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：219 / 229

页数：11

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