INTERPRETATION OF GHOST LINES IN SECONDARY-ELECTRON SPECTRA DETERMINED BY XPS

被引：1
|
作者：
GURKER, N [1 ]
EBEL, H [1 ]
ZEINER, K [1 ]
WECHSELBERGER, K [1 ]
FINSTER, J [1 ]
LEONHARD, G [1 ]
机构：
[1] KARL MARX UNIV,SEKT CHEM,DDR-701 LEIPZIG,GER DEM REP
来源：
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 1982年 / 25卷 / 2-3期
关键词：
D O I：
10.1016/0368-2048(82)85019-6
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
引用
收藏
页码：219 / 229
页数：11
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