RELIABILITY-ANALYSIS - OPTIMAL INSPECTION AND MAINTENANCE SCHEDULES OF FAILING SYSTEMS

被引：31

|

作者：

SHERIF, YS

机构：

来源：

MICROELECTRONICS RELIABILITY | 1982年 / 22卷 / 01期

关键词：

D O I：

10.1016/0026-2714(82)90051-8

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：59 / 115

页数：57

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