WAFER MAPPING AND DATA GRAPHICS FOR THE ELECTRICAL CHARACTERIZATION OF SEMICONDUCTOR-MATERIALS AND DEVICES

被引：0

作者：

VARKER, CJ ^{[1
]}

机构：

[1] MOTOROLA INC,SEMICOND RES & DEV LAB,PHOENIX,AZ 85008

来源：

JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1986年 / 133卷 / 03期

关键词：

D O I：

暂无

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

引用

页码：C105 / C105

页数：1

共 50 条

[1] ELECTRICAL CHARACTERIZATION OF SEMICONDUCTOR-MATERIALS AND DEVICES
SCHRODER, DK
[J]. ACS SYMPOSIUM SERIES, 1986, 295 : 18 - 33
[2] ELECTRICAL CHARACTERIZATION OF SEMICONDUCTOR-MATERIALS
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[J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1984, 187 (APR): : 1 - INDE
[3] ELECTRICAL CHARACTERIZATION OF SEMICONDUCTOR-MATERIALS
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ROBINSON, DAH
[J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1978, 125 (03) : C135 - C135
[4] DISLOCATIONS IN SEMICONDUCTOR-MATERIALS AND DEVICES
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[J]. ACTA PHYSICA HUNGARICA, 1984, 56 (1-4) : 119 - 130
[5] CHARACTERIZATION OF SEMICONDUCTOR-MATERIALS AND DEVICES BY SURFACE-ANALYSIS TECHNIQUES
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[J]. VACUUM, 1984, 34 (10-1) : 881 - 892
[6] CHARACTERIZATION OF SEMICONDUCTOR-MATERIALS AND DEVICES USING ACOUSTOELECTRIC VOLTAGE MEASUREMENT
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[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (01): : 95 - 110
[7] STM APPLICATIONS FOR SEMICONDUCTOR-MATERIALS AND DEVICES
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[J]. SURFACE SCIENCE, 1987, 181 (1-2) : 285 - 294
[8] SEMICONDUCTOR-MATERIALS FOR FUTURE DISPLAY DEVICES
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OWEN, SJT
[J]. ELECTROCOMPONENT SCIENCE AND TECHNOLOGY, 1976, 3 (02): : 67 - 75
[9] CATHODOLUMINESCENCE CHARACTERIZATION OF SEMICONDUCTOR-MATERIALS
ROEDEL, RJ
MYHAJLENKO, S
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ROWLEY, K
[J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1988, 135 (08) : C373 - C373
[10] SPECIAL ISSUE ON CHARACTERIZATION TECHNIQUES FOR SEMICONDUCTOR-MATERIALS, PROCESSES AND DEVICES - FOREWORD
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[J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1980, 27 (12) : 2203 - 2204

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