ELECTRICAL CHARACTERIZATION OF SEMICONDUCTOR-MATERIALS

被引：0

作者：

SCHRODER, DK ^{[1
]}

机构：

[1] ARIZONA STATE UNIV,DEPT ELECT & COMP ENGN,TEMPE,AZ 85287

来源：

ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 1984年 / 187卷 / APR期

关键词：

D O I：

暂无

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：1 / INDE

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[1] ELECTRICAL CHARACTERIZATION OF SEMICONDUCTOR-MATERIALS
MILLER, GL
ROBINSON, DAH
[J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1978, 125 (03) : C135 - C135
[2] ELECTRICAL CHARACTERIZATION OF SEMICONDUCTOR-MATERIALS AND DEVICES
SCHRODER, DK
[J]. ACS SYMPOSIUM SERIES, 1986, 295 : 18 - 33
[3] CATHODOLUMINESCENCE CHARACTERIZATION OF SEMICONDUCTOR-MATERIALS
ROEDEL, RJ
MYHAJLENKO, S
EDWARDS, JL
ROWLEY, K
[J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1988, 135 (08) : C373 - C373
[4] WAFER MAPPING AND DATA GRAPHICS FOR THE ELECTRICAL CHARACTERIZATION OF SEMICONDUCTOR-MATERIALS AND DEVICES
VARKER, CJ
[J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1986, 133 (03) : C105 - C105
[5] THE CHARACTERIZATION OF SEMICONDUCTOR-MATERIALS BY BACKSCATTERING SPECTROSCOPY
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[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1985, 10-1 (MAY): : 583 - 587
[6] CHARACTERIZATION OF SEMICONDUCTOR-MATERIALS BY RAMAN MICROPROBE
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[J]. IEEE JOURNAL OF QUANTUM ELECTRONICS, 1989, 25 (05) : 965 - 975
[7] CHARACTERIZATION OF SEMICONDUCTOR-MATERIALS BY WTEM AND SIMS
GANIERE, JD
BUFFAT, PA
KY, NH
BLANCHARD, B
SPYCHER, R
[J]. ANALUSIS, 1993, 21 (08) : M12 - M14
[8] SEMICONDUCTOR-MATERIALS
DECASTRO, E
[J]. ELETTROTECNICA, 1977, 64 (12): : 965 - 968
[9] ELEMENTAL AND ELECTRONIC CHARACTERIZATION OF SEMICONDUCTOR-MATERIALS WITH THE STEM
BATSON, PE
[J]. PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1984, 452 : 177 - 182
[10] ELECTRICAL-PROPERTIES OF SEMICONDUCTOR-MATERIALS - CHROMIUM TRIOXIDE
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[J]. THERMOCHIMICA ACTA, 1981, 51 (2-3) : 335 - 341

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