ELLIPSOMETRY AS A DIAGNOSTIC FOR THE MEASUREMENT OF EROSION AND REDEPOSITION IN A TOKAMAK

被引：3
|
作者：
DAVIES, SJ [1 ]
MONK, RD [1 ]
机构：
[1] UNIV LONDON,ROYAL HOLLOWAY & BEDFORD NEW COLL,DEPT PHYS,SURREY TW20 0EX,ENGLAND
来源：
JOURNAL OF NUCLEAR MATERIALS | 1992年 / 196卷
关键词：
D O I：
10.1016/S0022-3115(06)80028-0
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Ellipsometry has been studied as a possible technique for quantitative measurements of erosion and redeposition in a tokamak. The technique can determine film thickness down to typically approximately 1 nm and it is being considered for the pumped divertor phase of JET. Various aspects of ellipsometry relevant to its implementation on a tokamak are discussed. An ellipsometric system capable of performing in situ erosion/redeposition measurements with sufficient accuracy is described.
引用
收藏
页码：184 / 188
页数：5
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