PROSPECTS IN HIGH-RESOLUTION X-RAY PHOTOELECTRON MICROSCOPY

被引：4
|
作者：
CAZAUX, J
机构：
来源：
ULTRAMICROSCOPY | 1985年 / 17卷 / 01期
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D O I：
10.1016/0304-3991(85)90175-5
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
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页码：43 / 49
页数：7
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