MUTUAL COMPARISONS OF FULLY AUTOMATED JOSEPHSON-JUNCTION ARRAY VOLTAGE-STANDARD SYSTEMS

被引：0
|
作者：
IWASA, A [1 ]
SAKAMOTO, Y [1 ]
YOSHIDA, H [1 ]
ENDO, T [1 ]
机构：
[1] ADVANTEST SENDAI LAB LTD,AOBA KU,SENDAI 98931,JAPAN
来源：
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1993年 / 42卷 / 02期
关键词：
D O I：
10.1109/19.278584
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In order to test the performances of three sets of fully automated Josephson-junction array voltage-standard systems, mutual comparisons among those systems have been carried out. The results obtained show that each system can be reasonably operated with the assigned uncertainty of about one part in 10(8) in routine daily calibration of Zener-diode voltage standards.
引用
收藏
页码：368 / 371
页数：4
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