ELECTRON DETECTION BY MEANS OF SILICON SOLID-STATE IMAGERS

被引：1
|
作者：
DEBUSSCHERE, I
BRONCKAERS, E
CLAEYS, C
DECLERCK, G
机构：
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1988年 / 273卷 / 2-3期
关键词：
D O I：
10.1016/0168-9002(88)90069-1
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：636 / 639
页数：4
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