ELECTRON DETECTION BY MEANS OF SILICON SOLID-STATE IMAGERS

被引：1

|

作者：

DEBUSSCHERE, I

BRONCKAERS, E

CLAEYS, C

DECLERCK, G

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1988年 / 273卷 / 2-3期

关键词：

D O I：

10.1016/0168-9002(88)90069-1

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

收藏

页码：636 / 639

页数：4

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