共 50 条
- [46] Simulation of threading edge dislocation images in x-ray topographs of silicon carbide homo-epilayers Silicon Carbide and Related Materials 2005, Pts 1 and 2, 2006, 527-529 : 411 - 414
- [50] DIRECT BACKWARD CALCULATION FROM X-RAY DOUBLE CRYSTAL TOPOGRAPHS PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1991, 128 (02): : 269 - 283