共 50 条
- [42] SIMS CHEMICAL IMAGING ON FRACTURED SURFACE OF POLYMER BLEND [J]. POLYMER JOURNAL, 1989, 21 (04) : 353 - 356
- [44] SIMS depth profiling and TEM imaging of the SIMS altered layer [J]. APPLIED SURFACE SCIENCE, 2008, 255 (04) : 1381 - 1383
- [48] CHARACTERIZATION OF MATERIALS BY SECONDARY ION MASS-SPECTROMETRY (SIMS) - NEW POSSIBILITIES OF TRACE, MICRO AND SURFACE-ANALYSIS [J]. FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1983, 315 (07): : 575 - 590
- [50] HIGH-SPATIAL AND HIGH-MASS-RESOLUTION SIMS INSTRUMENT FOR THE SURFACE-ANALYSIS OF CHEMICALLY COMPLEX MATERIALS [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1989, 60 (01): : 53 - 64