AUTOCOLLIMATOR BASED ON MOIRE DEFLECTOMETRY

被引：11
|
作者：
GLATT, I [1 ]
LIVNAT, A [1 ]
KAFRI, O [1 ]
HELLER, D [1 ]
机构：
[1] ALLIED CORP,CORP TECHNOL,MT BETHEL,NJ 07060
来源：
APPLIED OPTICS | 1984年 / 23卷 / 16期
关键词：
D O I：
10.1364/AO.23.002673
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：2673 / 2674
页数：2
相关论文
共 50 条
  • [41] Aspheric surface measurement using moire deflectometry based on Digital Fourier Transform
    Wang, BX
    Luo, XZ
    Pfeifer, T
    Mischo, H
    ISTM/99: 3RD INTERNATIONAL SYMPOSIUM ON TEST AND MEASUREMENT, 1999, : 634 - 637
  • [42] Soft x-ray laser based moire deflectometry of dense plasmas
    Weber, FA
    Barbee, TW
    Celliers, PM
    Da Silva, LB
    Tanaka, K
    Kodama, R
    Takahashi, K
    SOFT X-RAY LASERS AND APPLICATIONS II, 1997, 3156 : 154 - 162
  • [43] AUTOMATIC FRINGE DETECTION ALGORITHM USED FOR MOIRE DEFLECTOMETRY
    SERVIN, M
    RODRIGUEZVERA, R
    CARPIO, M
    MORALES, A
    APPLIED OPTICS, 1990, 29 (22): : 3266 - 3270
  • [44] HIGH-SENSITIVITY MOIRE DEFLECTOMETRY USING A TELESCOPE
    KAFRI, O
    KRASINSKI, J
    APPLIED OPTICS, 1985, 24 (17): : 2746 - 2747
  • [45] REFLECTIVE SURFACE-ANALYSIS USING MOIRE DEFLECTOMETRY
    KAFRI, O
    LIVNAT, A
    APPLIED OPTICS, 1981, 20 (18): : 3098 - 3100
  • [46] Projection moire deflectometry for the automatic measurement of phase objects
    Wang, M
    OPTICAL ENGINEERING, 1996, 35 (07) : 2005 - 2011
  • [47] Measurement of Nanofluids Absorption Coefficient by Moire Deflectometry Technique
    Madanipour, Khosro
    Koohian, Ataollah
    Farahani, Shahrzad Shahrabi
    OPTICAL METHODS FOR INSPECTION, CHARACTERIZATION, AND IMAGING OF BIOMATERIALS II, 2015, 9529
  • [48] PERFORMANCE OF MOIRE DEFLECTOMETRY WITH DEFERRED ELECTRONIC HETERODYNE READOUT
    STRICKER, J
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1987, 4 (09): : 1798 - 1806
  • [49] AXISYMMETRIC DENSITY FIELD-MEASUREMENTS BY MOIRE DEFLECTOMETRY
    STRICKER, J
    KEREN, E
    KAFRI, O
    AIAA JOURNAL, 1983, 21 (12) : 1767 - 1769
  • [50] MOIRE DEFLECTOMETRY OF PHASE OBJECTS USING A SINGLE GRATING
    LI, Y
    EICHMANN, G
    APPLIED OPTICS, 1986, 25 (04): : 477 - 479
12345