AUTOCOLLIMATOR BASED ON MOIRE DEFLECTOMETRY

被引:11
|
作者
GLATT, I [1 ]
LIVNAT, A [1 ]
KAFRI, O [1 ]
HELLER, D [1 ]
机构
[1] ALLIED CORP,CORP TECHNOL,MT BETHEL,NJ 07060
来源
APPLIED OPTICS | 1984年 / 23卷 / 16期
关键词
D O I
10.1364/AO.23.002673
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
引用
收藏
页码:2673 / 2674
页数:2
相关论文
共 50 条
  • [1] LEVEL BASED ON MOIRE DEFLECTOMETRY
    LIVNAT, A
    KAFRI, O
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1982, 53 (11): : 1779 - 1781
  • [2] FREQUENCY MARKER BASED ON MOIRE DEFLECTOMETRY
    KAFRI, O
    MEYERSTEIN, D
    KARNY, Z
    OPTICS AND LASERS IN ENGINEERING, 1983, 4 (01) : 55 - 61
  • [3] ELECTRONIC MOIRE DEFLECTOMETRY
    SHARMA, DK
    DELISLE, C
    OPTICS COMMUNICATIONS, 1987, 64 (03) : 211 - 216
  • [4] Infinite fringe moire deflectometry based on phase calculation
    Wang, BX
    Shi, YQ
    4TH INTERNATIONAL IMEKO SYMPOSIUM ON LASER METROLOGY FOR PRECISION MEASUREMENT AND INSPECTION IN INDUSTRY, PROCEEDINGS, 1996, : 65 - 70
  • [5] MOIRE DEFLECTOMETRY WITH DEFERRED ANALYSIS
    RHODES, DB
    FRANKE, JM
    JONES, SB
    LEIGHTY, BD
    APPLIED OPTICS, 1983, 22 (05): : 652 - 653
  • [6] INFINITE FRINGE MOIRE DEFLECTOMETRY
    KAFRI, O
    LIVNAT, A
    KEREN, E
    APPLIED OPTICS, 1982, 21 (21): : 3884 - 3886
  • [7] DIFFRACTION EFFECTS IN MOIRE DEFLECTOMETRY
    KEREN, E
    KAFRI, O
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1985, 2 (02): : 111 - 120
  • [8] Fourier transform moire deflectometry
    Wang, M
    Li, DC
    Zhong, JG
    Chen, WM
    LASER INTERFEROMETRY IX: TECHNIQUES AND ANALYSIS, 1998, 3478 : 393 - 404
  • [9] Axial position detection for optical tweezers based on Moire Deflectometry
    Khorshad, Ali Akbar
    Reihani, S. Nader S.
    OPTICS COMMUNICATIONS, 2019, 446 : 33 - 38
  • [10] Moire deflectometry-based position detection for optical tweezers
    Khorshad, Ali Akbar
    Reihani, S. Nader S.
    Tavassoly, Mohammad Taghi
    OPTICS LETTERS, 2017, 42 (17) : 3506 - 3509