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- [31] MEASUREMENT OF HEAT-CAPACITY OF SEMICONDUCTING MATERIALS BY DIRECT HEATING PULSE METHOD AT HIGH-TEMPERATURESJOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1979, 12 (08): : 712 - 718NAITO, KINABA, HISHIDA, MSETA, K
- [32] ADDENDUM TO NON-FOURIERIAN HEAT-CONDUCTION IN SEMICONDUCTOR MULTILAYER SYSTEMS WITH THIN-LAYERS - ASYMPTOTIC-BEHAVIOR OF DECAY CONSTANTSPHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1987, 140 (02): : K97 - K98ENDERS, P
- [33] Identification of a Time-Dependent Coefficient in Heat Conduction Problem by New Iteration MethodADVANCES IN MATHEMATICAL PHYSICS, 2018, 2018Huang, DejianLi, YanqingPei, Donghe
- [34] Thermal conduction in ultra-thin pure and doped single crystal silicon layers at high temperaturesADVANCES IN ELECTRONIC PACKAGING 2005, PTS A-C, 2005, : 2295 - 2301Liu, WenjunAsheghi, Mehdi
- [35] Thermal conduction in ultra-thin pure and doped single crystal silicon layers at high temperaturesHT2005: PROCEEDINGS OF THE ASME SUMMER HEAT TRANSFER CONFERENCE 2005, VOL 4, 2005, : 821 - 827Liu, WenjunAsheghi, Mehdi
- [36] KINETICS OF THIAMINE DEGRADATION BY HEAT - NEW METHOD FOR STUDYING REACTION-RATES IN MODEL SYSTEMS AND FOOD PRODUCTS AT HIGH-TEMPERATURESJOURNAL OF FOOD SCIENCE, 1975, 40 (05) : 985 - 988MULLEY, EASTUMBO, CRHUNTING, WM
- [37] A NEW METHOD FOR MEASURING THE YIELD STRESS IN THIN-LAYERS OF SEDIMENTING BLOODBIOPHYSICAL JOURNAL, 1987, 52 (02) : 229 - 240MORRIS, CLSMITH, CMBLACKSHEAR, PL
- [38] NEW METHOD FOR DETERMINING TOTAL RADIATING POWER OF PARTIALLY TRANSPARENT MATERIALS AT HIGH-TEMPERATURESHIGH TEMPERATURE, 1972, 10 (02) : 354 - 359PETROV, VAREZNIK, VY
- [39] NEW METHOD OF TESTING SHEET-METAL UNDER BIAXIAL TENSION AT HIGH-TEMPERATURESINDUSTRIAL LABORATORY, 1980, 46 (04): : 374 - 377ZOLOTOV, MASKUDNOV, VA