SEMICONDUCTOR CATHODE PREPARATION FOR FIELD EMISSION MICROSCOPY

被引:4
|
作者
SAVAGE, WR
机构
来源
REVIEW OF SCIENTIFIC INSTRUMENTS | 1964年 / 35卷 / 05期
关键词
D O I
10.1063/1.1718885
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:605 / &
相关论文
共 50 条
  • [11] Improved preparation of membrane surfaces for field-emission scanning electron microscopy
    Schossig-Tiedemann, M
    Paul, D
    JOURNAL OF MEMBRANE SCIENCE, 2001, 187 (1-2) : 85 - 91
  • [12] TREATMENT OF OXIDE-CATHODE EMISSION BY SEMICONDUCTOR THEORY
    TISCHER, KM
    FREQUENZ, 1978, 32 (08) : 220 - 226
  • [13] Emission characteristics of several field emission cathode materials
    Bai X.
    Yang J.
    Zhang J.
    Ren H.
    Qiangjiguang Yu Lizishu/High Power Laser and Particle Beams, 2010, 22 (10): : 2393 - 2396
  • [14] Cathode technologies for field emission displays
    Nagno, Masayoshi
    IEEJ TRANSACTIONS ON ELECTRICAL AND ELECTRONIC ENGINEERING, 2006, 1 (02) : 171 - 178
  • [15] Collector dependence of field emission in the Scanning Field Emission Microscopy
    Gotsis, H. J.
    Bacalis, N. C.
    Xanthakis, J. P.
    2021 34TH INTERNATIONAL VACUUM NANOELECTRONICS CONFERENCE (IVNC), 2021, : 132 - 133
  • [16] SPIKE CATHODE FOR FIELD-EMISSION
    PFLEIDERER, H
    PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1972, 11 (01): : 153 - +
  • [17] Flexible Field Emission Cathode Materials
    Chen Shanliang
    Ying Pengzhan
    Wei Guodong
    Yang Weiyou
    PROGRESS IN CHEMISTRY, 2015, 27 (09) : 1313 - 1323
  • [18] FIELD EMISSION SHADOW MICROSCOPY
    MELMED, AJ
    APPLIED PHYSICS LETTERS, 1968, 12 (03) : 100 - &
  • [19] DEPTH OF FIELD IN EMISSION MICROSCOPY
    REMPFER, GF
    NADAKAVUKAREN, KK
    GRIFFITH, OH
    ULTRAMICROSCOPY, 1980, 5 (04) : 449 - 457
  • [20] FIELD EMISSION MICROSCOPY OF CARBON
    HUGHES, ID
    MONTAGUP.HM
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1970, 3 (02) : 228 - &