SPECTROSCOPIC AND STRUCTURAL-PROPERTIES OF LOW-TEMPERATURE NITROGEN DOPED SIO2-FILMS

被引：0

作者：

ANDERSON, GW ^{[1
]}

SCHMIDT, WA ^{[1
]}

COMAS, J ^{[1
]}

机构：

[1] USN,RES LAB,WASHINGTON,DC 20375

来源：

BULLETIN OF THE AMERICAN PHYSICAL SOCIETY | 1978年 / 23卷 / 03期

关键词：

D O I：

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中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

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页码：455 / 455

页数：1

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