CALCULATION AND MEASUREMENT OF MAGNETOSTRICTIVE CONSTANTS OF THIN-LAYERS

被引：3

|

作者：

KWAAITAAL, T

LUYMES, BJ

VANDENEIJNDEN, WMM

机构：

来源：

JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 1982年 / 26卷 / 1-3期

关键词：

D O I：

10.1016/0304-8853(82)90149-4

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

收藏

页码：187 / 190

页数：4

相关论文

共 50 条

[1] MEASUREMENT OF THE THICKNESS OF THIN-LAYERS BY ULTRASONIC INTERFEROMETRY
HOUZE, M
NONGAILLARD, B
GAZALET, M
ROUVAEN, JM
BRUNEEL, C
[J]. JOURNAL OF APPLIED PHYSICS, 1984, 55 (01) : 194 - 198
[2] COMPARATIVE STUDY ON METHODS FOR MEASUREMENT OF THICKNESS OF THIN-LAYERS
SANTAS, JC
[J]. ANALES DE FISICA, 1972, 68 (7-9): : 217 - 219
[3] MEASUREMENT OF REAL REFRACTIVE-INDEX OF THIN-LAYERS
BODENHEIMER, JS
[J]. APPLIED OPTICS, 1980, 19 (07): : 1031 - 1032
[4] MEASUREMENT OF DRYING RATES IN THIN-LAYERS OF RYEGRASS SEED
NELLIST, ME
OCALLAGH.JR
[J]. JOURNAL OF AGRICULTURAL ENGINEERING RESEARCH, 1971, 16 (03): : 192 - &
[5] A METHOD FOR THE MEASUREMENT OF THE THERMAL-CONDUCTIVITY TENSOR IN THIN-LAYERS
GLUZMAN, N
AUSLENDER, M
[J]. THIN SOLID FILMS, 1994, 249 (02) : 245 - 249
[6] A COMPARATIVE SURVEY OF THE EVALUATION OF OPTICAL-CONSTANTS OF WEAKLY ABSORBING THIN-LAYERS
MICHAILOVITS, L
HEVESI, I
TOROK, MI
SZORENYI, T
SULI, A
[J]. ACTA PHYSICA HUNGARICA, 1984, 55 (1-4) : 241 - 245
[7] SEISMIC PROPERTIES OF THIN-LAYERS
BERKHOUT, AJ
DEVRIES, D
[J]. GEOPHYSICS, 1984, 49 (05) : 668 - 668
[8] STRUCTURE OF WATER IN THIN-LAYERS
DERJAGUIN, BV
CHURAEV, NV
[J]. LANGMUIR, 1987, 3 (05) : 607 - 612
[9] BIDIMENSIONAL OPTICS IN THIN-LAYERS
VINCENT, D
LIT, JWY
[J]. CANADIAN JOURNAL OF PHYSICS, 1979, 57 (01) : 45 - 53
[10] ELECTRODE CONNECTION TO THIN-LAYERS
KRIKSHTOPAITIS, IB
[J]. PRIBORY I TEKHNIKA EKSPERIMENTA, 1974, (06): : 195 - 196

← 1 2 3 4 5 →