STRUCTURE AND ELECTRETS PROPERTIES OF POLYPROPYLENE FILMS WITH AMORPHOUS DIOXIDE OF SILICON

被引：0
|
作者：
Smirnov, A. V.
Fedorov, B. A.
Temnov, D. E.
Fomicheva, E. E.
机构：
来源：
NANOSYSTEMS-PHYSICS CHEMISTRY MATHEMATICS | 2012年 / 3卷 / 02期
关键词：
D O I：
暂无
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
引用
收藏
页码：65 / 72
页数：8
相关论文
共 50 条
  • [21] Structure and Optical Properties of Silicon Nanocrystals Embedded in Amorphous Silicon Thin Films Obtained by PECVD
    Monroy, B. M.
    Remolina, A.
    Garcia-Sanchez, M. F.
    Ponce, A.
    Picquart, M.
    Santana, G.
    JOURNAL OF NANOMATERIALS, 2011, 2011
  • [22] Structure and spectroscopy of amorphous silicon dioxide at the silicon/silicon oxide interface.
    Holl, MMB
    Greeley, NJ
    McFeely, FR
    Zhang, KZ
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1998, 215 : U160 - U160
  • [23] ON THE CHARGE STORAGE AND DECAY MECHANISM IN SILICON DIOXIDE ELECTRETS
    OLTHUIS, W
    BERGVELD, P
    IEEE TRANSACTIONS ON ELECTRICAL INSULATION, 1992, 27 (04): : 691 - 697
  • [24] Hyperfine structure of the E′δ centre in amorphous silicon dioxide
    Buscarino, G.
    Agnello, S.
    Gelardi, F. M.
    JOURNAL OF PHYSICS-CONDENSED MATTER, 2006, 18 (22) : 5213 - 5219
  • [25] RING STRUCTURE OF THE CRYSTALLINE AND AMORPHOUS FORMS OF SILICON DIOXIDE
    GUTTMAN, L
    JOURNAL OF NON-CRYSTALLINE SOLIDS, 1990, 116 (2-3) : 145 - 147
  • [26] Leakage currents and silicon dangling bonds in amorphous silicon dioxide thin films
    Lenahan, PM
    Mele, JJ
    Lowry, RK
    Woodbury, D
    JOURNAL OF NON-CRYSTALLINE SOLIDS, 2000, 266 : 835 - 839
  • [27] Structure and properties of hydrogenated amorphous silicon carbide thin films deposited by PECVD
    Zhang, Yiying
    Du, Piyi
    Zhang, Ran
    Han, Gaorong
    Weng, Wenjian
    JOURNAL OF NON-CRYSTALLINE SOLIDS, 2008, 354 (12-13) : 1435 - 1439
  • [28] Structure and optical properties of amorphous silicon oxide thin films with different porosities
    Rinnert, H
    Vergnat, M
    JOURNAL OF NON-CRYSTALLINE SOLIDS, 2003, 320 (1-3) : 64 - 75
  • [29] Structure, stability and photoelectronic properties of transition films from amorphous to microcrystalline silicon
    Hao, HY
    Liao, XB
    Zeng, XB
    Diao, HW
    Xu, Y
    Kong, GL
    JOURNAL OF CRYSTAL GROWTH, 2005, 281 (2-4) : 344 - 348
  • [30] THE STRUCTURE OF SILICON FILMS GROWN ON AN AMORPHOUS SUBSTRATE
    LIMANOV, AB
    MUSATOVA, LV
    RASEV, MM
    TIKHONOVA, AA
    GIVARGIZOV, EI
    KRISTALLOGRAFIYA, 1988, 33 (01): : 254 - 257
12345