MODIFIED ELECTRONIC SPECKLE PATTERN INTERFEROMETER EMPLOYING AN OFF-AXIS REFERENCE BEAM

被引：15
|
作者：
JOENATHAN, C
TORROBA, R
机构：
[1] Rose Hulman Institute of Technology, Department of Applied Optics and Physics, Terre Haute, IN, 47803
来源：
APPLIED OPTICS | 1991年 / 30卷 / 10期
关键词：
D O I：
10.1364/AO.30.001169
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
[No abstract available]
引用
收藏
页码：1169 / 1171
页数：3
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