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- [1] DIRECT OBSERVATION OF LATTICE DEFECTS IN COLD-WORKED HIGH MANGANESE STEELS BY MEANS OF ELECTRON MICROSCOPYJOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1960, 15 (11) : 1963 - 1969NISHIYAMA, ZSIMIZU, KI
- [2] OBSERVATION OF CRYSTAL DEFECTS IN SILICON AND COMPOUND SEMICONDUCTORS BY TRANSMISSION ELECTRON MICROSCOPY (TEM).National Technical Report (Matsushita Electric Industry Company), 1977, 23 (01): : 134 - 141Ichikawa, ShojiroHarada, Yosikazu
- [3] THE DIRECT OBSERVATION OF LATTICE DEFECTS BY FIELD ION MICROSCOPYPHILOSOPHICAL MAGAZINE, 1961, 6 (68): : 1035 - &BRANDON, DGWALD, M
- [4] OBSERVATION OF DISLOCATIONS IN SILICON BY TRANSMISSION ELECTRON MICROSCOPYJOURNAL OF THE INSTITUTE OF METALS, 1962, 91 (02): : 77 - &CHARIG, JMJOYCE, BASTIRLAND, DJ
- [5] DIRECT OBSERVATION OF LATTICE IMPERFECTIONS IN PEARLITES BY ELECTRON MICROSCOPYJOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1961, 16 (04) : 834 - &NISHIYAMA, ZEGUCHI, IKATO, KKOREEDA, A
- [6] OBSERVATION OF LATTICE DEFECTS IN GRAPHITE BY ELECTRON MICROSCOPY, .1.JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1961, 16 (02) : 214 - &FUJITA, FEIZUI, K
- [7] OBSERVATION OF CRYSTAL-LATTICE DEFECTS BY ELECTRON INTERFERENCE MICROSCOPYUKRAINSKII FIZICHESKII ZHURNAL, 1982, 27 (05): : 726 - 732SCHEERSCHMIDT, KNEPIYKO, SAKARL, S
- [9] INVESTIGATION OF THE OXYGEN-RELATED LATTICE-DEFECTS IN CZOCHRALSKI SILICON BY MEANS OF ELECTRON-MICROSCOPY TECHNIQUESPHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1984, 86 (01): : 245 - 261BENDER, H
- [10] A DIRECT OBSERVATION OF COLD TENSILE DEFORMED TITANIUM BY MEANS OF ELECTRON MICROSCOPYTRANSACTIONS OF THE JAPAN INSTITUTE OF METALS, 1964, 5 (04): : 214 - &YAMANE, TUEDA, J