High-current pulsed electron beam modification on microstructure and performance of Cu/CuW diffusion bonding joints

被引:0
|
作者
Na-Na Tian [1 ]
Cong-Lin Zhang [1 ,2 ]
Peng Lyu [1 ]
Jin-Tong Guan [1 ]
Jie Cai [3 ]
Qing-Feng Guan [1 ]
Shun Guo [1 ]
机构
[1] School of Materials Science and Engineering,Jiangsu University
[2] School of Material Science and Engineering,Yancheng Institute of Technology
[3] Engineering Institute of Advanced Manufacturing and Modern Equipment Technology,Jiangsu University
基金
中国国家自然科学基金;
关键词
D O I
暂无
中图分类号
TG407 [焊接接头的力学性能及其强度计算];
学科分类号
摘要
This study investigates the influence of high-current pulsed electron beam(HCPEB) modification on the microstructure and shear strength of Cu/CuW joints.Reliable solid-state diffusion bonding of modified-Cu(MCu) and modified-CuW(M-CuW) was achieved by HCPEB modification pretreatment at a temperature of 800-900 ℃ and a pressure of 5 MPa for 10-50 min.Experiments demonstrate that HCPEB modification facilitates the dissolution of W and Cu,resulting in the formation of a Cu0.4W0.6solid solution and thus enhancing the uniform distribution of microstructures.Additionally,HCPEB-induced defects play a beneficial role in promoting the diffusion process by providing fast diffusion paths for elements.The optimal joints with the maximum shear strength of 213.7 MPa were obtained through bonding M-Cu and M-CuW at 900℃ and 5 MPa for 30 min,which attributes to the combined effects of fine-grained strengthening and solid solution strengthening.Overall,the application of HCPEB modification showcases its effectiveness in promoting element diffusion and enhancing the mechanical performance of the joints.
引用
收藏
页码:2819 / 2831
页数:13
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