Electron differaction patterns with curved Kikuchi lines

被引：0
|
作者：
R. K. Karakhanyan
K. R. Karakhanyan
机构：
[1] Yerevan State University,
来源：
Crystallography Reports | 2007年 / 52卷
关键词：
61.14.-x;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Curved Kikuchi lines have been observed in electron diffraction patterns obtained for silicon by transmission electron microscopy. It is found that the curvature of Kikuchi lines is related to the shift of point reflections from their normal positions. The formation of curved Kikuchi lines stems from the local structural defects in the crystals under study.
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页码：768 / 769
页数：1
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