Rapid characterization of ultrafiltration membranes by scanning electron microscopy

被引：0
|
作者：
F. J. Márquez-Rocha
M. Aguilar-Juárez
M. J. Acosta-Ruíz
M. I. Gradilla
机构：
[1] Center for Scientific Research and High Education of Ensenada,Department of Marine Biotechnology
[2] Center for Scientific Research and High Education of Ensenada,Department of Aquaculture
[3] UNAM,Scientific Center of Condensed Matter
来源：
Russian Chemical Bulletin | 2001年 / 50卷
关键词：
ultrafiltration membranes; scanning electron microscopy; topographic analysis; elemental analysis;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Physicochemical properties of ultrafiltration membranes were studied by scanning electron microscopy. The membrane elemental composition (carbon, oxygen, and sulfur) was determined by energy dispersion analysis. The elements were shown to be homogeneously distributed along the membrane. A homogeneous pore distribution on the membrane surface was found after covering it with a thin gold layer. The pore sizes are ∼50 nm. The topographic analysis of the permeate-side of the membrane indicated its anisotropy.
引用
收藏
页码：1320 / 1322
页数：2
相关论文
共 50 条
  • [41] Characterization of humic substances by environmental scanning electron microscopy
    Redwood, PS
    Lead, JR
    Harrison, RM
    Jones, IP
    Stoll, S
    ENVIRONMENTAL SCIENCE & TECHNOLOGY, 2005, 39 (07) : 1962 - 1966
  • [42] Ultrastructural characterization of amyloidoma by scanning and transmission electron microscopy
    Garcia, C. A.
    Gamb, S. I.
    Miller, D. V.
    LABORATORY INVESTIGATION, 2008, 88 : 374A - 375A
  • [43] Waste characterization by scanning electron microscopy for material recovery
    Gente, Vincenzo
    La Marca, Floriana
    Massacci, Paolo
    Serranti, Silvia
    PARTICULATE SCIENCE AND TECHNOLOGY, 2007, 25 (05) : 481 - 494
  • [44] SEMICONDUCTOR CRYSTAL CHARACTERIZATION BY SCANNING ELECTRON-MICROSCOPY
    LEAMY, HJ
    KIMERLING, LC
    FERRIS, SD
    JOURNAL OF ELECTRONIC MATERIALS, 1976, 5 (04) : 450 - 450
  • [45] CHARACTERIZATION OF TRIBOLOGICAL SURFACES BY SCANNING ELECTRON ACOUSTIC MICROSCOPY
    HOLSTEIN, WL
    SCHMIDT, FE
    BEGNOCHE, BC
    WEAR, 1987, 116 (01) : 119 - 129
  • [46] Residual stress characterization by scanning electron acoustic microscopy
    Hong, Y
    Zhang, ZN
    Zhang, SY
    Li, ZQ
    Shui, XJ
    ACOUSTICAL IMAGING, VOL 25, 2000, 25 : 273 - 278
  • [47] Scanning microscopy technologies: Scanning electron microscopy and scanning probe microscopy
    Nessler, R
    SCANNING, 1999, 21 (02) : 137 - 137
  • [48] Phase-contrast scanning force microscopy and chemical heterogeneity of GR polysulfone ultrafiltration membranes
    Palacio, L
    Prádanos, P
    Hernández, A
    Ariza, MJ
    Benavente, J
    Nyström, M
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2001, 73 (05): : 555 - 560
  • [49] Phase-contrast scanning force microscopy and chemical heterogeneity of GR polysulfone ultrafiltration membranes
    L. Palacio
    P. Prádanos
    A. Hernández
    M.J. Ariza
    J. Benavente
    M. Nyström
    Applied Physics A, 2001, 73 : 555 - 560
  • [50] CHARACTERIZATION OF NAFION MEMBRANES BY TRANSMISSION ELECTRON-MICROSCOPY
    XUE, T
    TRENT, JS
    OSSEOASARE, K
    JOURNAL OF MEMBRANE SCIENCE, 1989, 45 (03) : 261 - 271
12345