Direct evidence of au segregation in laser welded au-coated invar material

被引:0
|
作者
S. C. Wang
S. Chi
K. C. Hsieh
Y. D. Yang
W. H. Cheng
机构
[1] Telecommunication Laboratories,Institute of Electro
[2] National Chiao Tung University,Optical Engineering
[3] National Sun Yat-sen University,Institute of Materials Science and Engineering
[4] National Sun Yat-sen University,Institute of Electro
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关键词
Au coating; Invar material; laser welding; optoelectronic; packaging;
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学科分类号
摘要
Evidence of the Au segregation within the crack region in laser welded Au-coated Invar material for semiconductor laser packaging is investigated. Results obtained from the metallography, scanning electron microscope (SEM) mapping, energy dispersive spectrometer (EDS) line profile, and Auger electron spectroscopy find that the cracks in the welded joints occur around the Au rich boundaries. The SEM Au mapping and EDS line profiles show that Au accumulates at the crack region. This direct observation indicates that one of the primary causes of cracks in laser welded Au-coated materials is due to the segregation of Au in the final stage of solidification. Detailed knowledge of the defect formation mechanisms in laser welded Au-coated materials is important for the practical design and fabrication of reliable optoelectronic packaging.
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页码:L21 / L23
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