Analytical TEM investigations of high-temperature superconductors

Electron diffraction and energy dispersive X-ray spectroscopy as analytical transmission electron microscopic methods have been applied to Y-Ba-Cu-O superconductors. The evaluation of diffraction patterns by means of the MS-WINDOWS program ELDISCA is demonstrated. The course of X-ray linescan signals in the transition range between YBa2Cu3O7−δ matrix and Y2BaCuO5 inclusions is explained by calculations based on a mathematical model which is described. Errors of quantiative X-ray spectroscopic results and their reasons are shown.