Analysis of meteorite samples using PIXE technique

被引：0
|
作者：
J. Zeman
M. Ješkovský
J. Kaizer
J. Pánik
I. Kontuľ
J. Staníček
P. P. Povinec
机构：
[1] Comenius University,Faculty of Mathematics, Physics and Informatics, Centre for Nuclear and Accelerator Technologies (CENTA)
[2] Comenius University,Faculty of Medicine, Institute of Medical Physics, Biophysics, Informatics and Telemedicine
来源：
Journal of Radioanalytical and Nuclear Chemistry | 2019年 / 322卷
关键词：
PIXE; Meteorite; Proton beam; Distribution maps; Absolute concentration;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
A non-destructive approach to the sample treatment during the analytical process is one of the crucial advantages of the particle induced X-ray emission technique. Rare and precious environmental and space samples can be analyzed in order to evaluate concentrations of individual elements presented in specimens. A non-destructive analysis of two meteorite samples was carried out using 3 MeV protons incident in a narrow ion beam (1.5 mm diam.). GUPIXWIN software package was used for spectra evaluation. Concentrations of several elements (Fe, Ni, Cu and Zn) were determined and quantitative surface elemental distribution maps were constructed.
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页码：1897 / 1903
页数：6
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