Analysis of meteorite samples using PIXE technique

被引：3
|
作者：
Zeman, J. [1 ]
Jeskovsky, M. [1 ]
Kaizer, J. [1 ]
Panik, J. [2 ]
Kontul, I. [1 ]
Stanicek, J. [1 ]
Povinec, P. P. [1 ]
机构：
[1] Comenius Univ, Fac Math Phys & Informat, Ctr Nucl & Accelerator Technol CENTA, Bratislava 84248, Slovakia
[2] Comenius Univ, Fac Med, Inst Med Phys Biophys Informat & Telemed, Bratislava 81372, Slovakia
来源：
JOURNAL OF RADIOANALYTICAL AND NUCLEAR CHEMISTRY | 2019年 / 322卷 / 03期
关键词：
PIXE; Meteorite; Proton beam; Distribution maps; Absolute concentration; RUMANOVA;
D O I：
10.1007/s10967-019-06851-9
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
A non-destructive approach to the sample treatment during the analytical process is one of the crucial advantages of the particle induced X-ray emission technique. Rare and precious environmental and space samples can be analyzed in order to evaluate concentrations of individual elements presented in specimens. A non-destructive analysis of two meteorite samples was carried out using 3 MeV protons incident in a narrow ion beam (1.5 mm diam.). GUPIXWIN software package was used for spectra evaluation. Concentrations of several elements (Fe, Ni, Cu and Zn) were determined and quantitative surface elemental distribution maps were constructed.
引用
收藏
页码：1897 / 1903
页数：7
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