共 50 条
- [41] Electrochemical migration behavior of Sn–3.0Ag–0.5Cu solder alloy under SO2 polluted thin electrolyte layers Journal of Materials Science: Materials in Electronics, 2019, 30 : 5652 - 5661
- [42] Unique interfacial reaction and so-induced change in mechanical performance of Sn–3.0Ag–0.5Cu/Cu solder joints formed during undercooled and eutectic liquid soldering processes Journal of Materials Science: Materials in Electronics, 2019, 30 : 4770 - 4781
- [44] Comparative study of normal and thin Au/Pd/Ni(P) surface finishes with Sn–3.0Ag–0.5Cu solder joints under isothermal aging Journal of Materials Science: Materials in Electronics, 2021, 32 : 24790 - 24800
- [46] Intermetallic Compound Growth between Electroless Nickel/Electroless Palladium/Immersion Gold Surface Finish and Sn-3.5Ag or Sn-3.0Ag-0.5Cu Solder Journal of Electronic Materials, 2018, 47 : 2507 - 2511
- [47] Influence of TiO2 nanoparticles on IMC growth in Sn–3.0Ag–0.5Cu–xTiO2 solder joints during isothermal aging process Journal of Materials Science: Materials in Electronics, 2014, 25 : 981 - 991
- [49] Effect of Pd Thickness on the Interfacial Reaction and Shear Strength in Solder Joints Between Sn-3.0Ag-0.5Cu Solder and Electroless Nickel/Electroless Palladium/Immersion Gold (ENEPIG) Surface Finish Journal of Electronic Materials, 2012, 41 : 763 - 773
- [50] Cross-solder interaction on interfacial reactions in Ni/Sn-3.0Ag-0.5Cu/Cu solder interconnects 2016 17TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT), 2016, : 542 - 545