Transient spectroscopy of Ryvkin’s α centers

被引：0
|
作者：
A. P. Odrinsky
机构：
[1] National Academy of Sciences of Belarus,Institute of Technical Acoustics
来源：
Semiconductors | 2011年 / 45卷
关键词：
Charge Exchange; Deep Level Transient Spectroscopy; Characteristic Relaxation Time; Anomalous Temperature Dependence; Electron Thermal Emission;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
The features of the DLTS detection of defects with retrappability of thermally excited carriers due to a large value of effective capture cross section are considered. Indications allowing identification of the implementation of the given model are found.
引用
收藏
页码：857 / 860
页数：3
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