共 50 条
- [2] DETERMINATION OF THE PARAMETERS OF DEEP CENTERS IN HIGH-RESISTIVITY SEMICONDUCTORS BY THE METHOD OF OPTICAL TRANSIENT CURRENT SPECTROSCOPY [J]. SOVIET PHYSICS SEMICONDUCTORS-USSR, 1986, 20 (08): : 897 - 899
- [5] DEEP LEVEL FOURIER SPECTROSCOPY FOR DETERMINATION OF DEEP LEVEL PARAMETERS [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1982, 21 (03): : 462 - 466
- [8] Determination of trap parameters in polyimide films by deep level transient spectroscopy [J]. CONFERENCE RECORD OF THE 1998 IEEE INTERNATIONAL SYMPOSIUM ON ELECTRICAL INSULATION, VOLS 1 AND 2, 1998, : 206 - 209
- [9] DETERMINATION OF DEEP-LEVEL PARAMETERS BY ISOTHERMAL DEEP-LEVEL TRANSIENT SPECTROSCOPY WITH OPTICAL-EXCITATION [J]. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1993, 138 (01): : 241 - 248
- [10] Deep defect centers in silicon carbide monitored with deep level transient spectroscopy [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1997, 162 (01): : 199 - 225