Simple multi-wavelength imaging of birefringence:case study of silk

被引:0
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作者
Reo Honda
Meguya Ryu
Jing-Liang Li
Vygantas Mizeikis
Saulius Juodkazis
Junko Morikawa
机构
[1] Tokyo Institute of Technology,Research Institute of Electronics
[2] Institute for Frontier Materials,Melbourne Center for Nanofabrication
[3] Deakin University,undefined
[4] Shizuoka University,undefined
[5] Swinburne University of Technology,undefined
[6] John st.,undefined
[7] Australian National Fabrication Facility,undefined
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关键词
Birefringence; Silk Fibers; Slow Axis; Phase Retarder; Budget Fraction;
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摘要
Polarised light imaging microscopy, with the addition of a liquid crystal (LC) phase retarder, was used to determine the birefringence of silk fibres with high (∼1 μm) spatial resolution. The measurement was carried out with the silk fibres (the optical slow axis) and the slow axis of the LC-retarder set at parallel angles. The direct fit of the transmission data allowed for high fidelity determination of the birefringence Δn ≈ 1.63 × 10−2 (with ∼2% uncertainty) of the brown silk fibre, (Antheraea pernyi) averaged over the wavelength range λ = (425–625) nm. By measuring retardance at four separate wavelengths, it was possible to determine the true value of the birefringence of a thicker sample when an optical path may include a large number of wavelengths. The numerical procedures and required hardware are described for the do-it-yourself assembly of the imaging polariscope at a fractional budget compared to commercial units.
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