X-ray diffraction study of the molecular propolis films deposited from an alcohol solution onto the cleavage surfaces of layered V2VI3 compounds

被引:0
|
作者
S. I. Drapak
S. V. Gavrylyuk
V. M. Kaminskii
Z. D. Kovalyuk
机构
[1] National Academy of Sciences of Ukraine,Frantsevich Institute of Materials Science Problems, Chernivtsi Branch
来源
Technical Physics | 2008年 / 53卷
关键词
61.05.cp; 62.23.St; 68.65.-k;
D O I
暂无
中图分类号
学科分类号
摘要
The structures of the molecular propolis films deposited from an alcohol solution on the (0001) cleavage surface of layered bismuth selenide and telluride are studied by X-ray diffraction. Despite the chemical interaction between the semiconductor substrates and the organic-substance components, the molecular structural ordering of the propolis films is shown to be identical to that in the films of this substance on the surface of amorphous glass substrates. The chemical and deformation interaction between the organic substance and the layered V2VI3 compounds is found to result in the formation of an organic-inorganic sandwich nanostructure at a distance of ∼0.3 μm from the layered crystal-propolis film interface.
引用
收藏
页码:1215 / 1221
页数:6
相关论文
共 50 条
  • [31] X-RAY SPECTROSCOPIC STUDY OF SOME TERNARY COMPOUNDS OF THE TYPE A-I-B-III-C2-VI AND A-I-B-V-C2-VI
    DESHPANDE, AP
    SAPRE, VB
    MANDE, C
    JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1984, 17 (05): : 955 - 960
  • [32] Combined synchrotron x-ray diffraction and micro-Raman for following in situ the growth of solution-deposited YBa2Cu3O7 thin films
    F. Berberich
    H. Graafsma
    B. Rousseau
    A. Canizares
    R. Ramy Ratiarison
    N. Raimboux
    P. Simon
    P. Odier
    N. Mestres
    T. Puig
    X. Obradors
    Journal of Materials Research, 2005, 20 : 3270 - 3272
  • [33] Combined synchrotron x-ray diffraction and micro-Raman for following in situ the growth of solution-deposited YBa2Cu3O7 thin films
    Berberich, F
    Graafsma, H
    Rousseau, B
    Canizares, A
    Ratiarison, RR
    Raimboux, N
    Simon, P
    Odier, P
    Mestres, N
    Puig, T
    Obradors, X
    JOURNAL OF MATERIALS RESEARCH, 2005, 20 (12) : 3270 - 3273
  • [34] Single crystal X-ray diffraction study of the vanadate garnet Ca2NaZn2V3O12
    Nakatsuka, A
    Ikuta, Y
    Yoshiasa, A
    Iishi, K
    MATERIALS RESEARCH BULLETIN, 2004, 39 (7-8) : 949 - 956
  • [35] X-ray Diffraction Study of Mixed-Layer Compounds in the Pseudobinary System SnTe–Bi2Te3
    O. G. Karpinskii
    L. E. Shelimova
    M. A. Kretova
    E. S. Avilov
    V. S. Zemskov
    Inorganic Materials, 2003, 39 : 240 - 246
  • [36] X-ray diffraction study of mixed-layer compounds in the pseudobinary system SnTe-Bi2Te3
    Karpinskii, OG
    Shelimova, LE
    Kretova, MA
    Avilov, ES
    Zemskov, VS
    INORGANIC MATERIALS, 2003, 39 (03) : 240 - 246
  • [37] X-ray diffraction and extended X-ray absorption fine structure study of epitaxial mixed ternary bixbyite PrxY2-xO3 (x=0-2) films on Si (111)
    Niu, G.
    Zoellner, M. H.
    Zaumseil, P.
    Pouliopoulos, A.
    d'Acapito, F.
    Schroeder, T.
    Boscherini, F.
    JOURNAL OF APPLIED PHYSICS, 2013, 113 (04)
  • [38] X-ray powder diffraction study of monoclinic V4+-ZrO2 solid solutions obtained from gels
    Torres, FJ
    Amigó, JM
    Alarcón, J
    JOURNAL OF SOLID STATE CHEMISTRY, 2003, 173 (01) : 40 - 44
  • [39] The vanadate garnet Ca2NaCd2V3O12: a single-crystal X-ray diffraction study
    Tokuda, Makoto
    Yoshiasa, Akira
    Mashimo, Tsutomu
    Iishi, Kazuake
    Nakatsuka, Akihiko
    ACTA CRYSTALLOGRAPHICA SECTION C-STRUCTURAL CHEMISTRY, 2018, 74 : 460 - +
  • [40] X-RAY DIFFRACTION STUDY OF STRUCTURE OF CaO-Al2O3-SiO2 TERNARY COMPOUNDS IN MOLTEN AND CRYSTALLINE STATES
    Sokol'skii, V. E.
    Pruttskov, D., V
    Yakovenko, O. M.
    Kazimirov, V. P.
    Roik, O. S.
    Golovataya, N., V
    Sokolsky, G., V
    JOURNAL OF MINING AND METALLURGY SECTION B-METALLURGY, 2020, 56 (02) : 269 - 277