X-ray diffraction study of the molecular propolis films deposited from an alcohol solution onto the cleavage surfaces of layered V2VI3 compounds

被引:0
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作者
S. I. Drapak
S. V. Gavrylyuk
V. M. Kaminskii
Z. D. Kovalyuk
机构
[1] National Academy of Sciences of Ukraine,Frantsevich Institute of Materials Science Problems, Chernivtsi Branch
来源
Technical Physics | 2008年 / 53卷
关键词
61.05.cp; 62.23.St; 68.65.-k;
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学科分类号
摘要
The structures of the molecular propolis films deposited from an alcohol solution on the (0001) cleavage surface of layered bismuth selenide and telluride are studied by X-ray diffraction. Despite the chemical interaction between the semiconductor substrates and the organic-substance components, the molecular structural ordering of the propolis films is shown to be identical to that in the films of this substance on the surface of amorphous glass substrates. The chemical and deformation interaction between the organic substance and the layered V2VI3 compounds is found to result in the formation of an organic-inorganic sandwich nanostructure at a distance of ∼0.3 μm from the layered crystal-propolis film interface.
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页码:1215 / 1221
页数:6
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