共 50 条
- [42] Micro-Raman analysis of a micromachined 3C-SiC cantilever SILICON CARBIDE AND RELATED MATERIALS 2011, PTS 1 AND 2, 2012, 717-720 : 525 - +
- [43] Raman investigation of stress relaxation at the 3C-SiC/Si interface SILICON CARBIDE, III-NITRIDES AND RELATED MATERIALS, PTS 1 AND 2, 1998, 264-2 : 395 - 398
- [44] Raman scattering in polycrystalline 3C-SiC: Influence of stacking faults PHYSICAL REVIEW B, 1998, 58 (15): : 9858 - 9862
- [45] Raman scattering spectroscopy of 3C-SiC(111) heteroepitaxial films Yamanaka, Mitsugu, 1600, Publ by JJAP, Minato-ku (33):
- [46] Raman scattering analyses of stacking faults in 3C-SiC crystals Silicon Carbide and Related Materials 2005, Pts 1 and 2, 2006, 527-529 : 343 - 346
- [47] Raman investigation of stress relaxation at the 3C-SiC/Si interface Materials Science Forum, 1998, 264-268 (pt 1): : 395 - 398
- [48] PRESSURE-DEPENDENCE OF RAMAN PHONONS OF GE AND 3C-SIC PHYSICAL REVIEW B, 1982, 25 (02): : 1151 - 1160
- [49] Methodological aspects of the GW calculation of the carbon vacancy in 3C-SiC NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2012, 277 : 77 - 79