Advanced Characterization of Pb-Free Interconnects

被引：0
|
作者：
Richard Coyle
Babak Arfaei
机构：
[1] Nokia Bell Labs Reliability Engineering,Research and Advanced Engineering
[2] Ford Motor Company,Physics Department
[3] Binghamton University,undefined
来源：
JOM | 2016年 / 68卷
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摘要：
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页码：2869 / 2870
页数：1
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