Scanning near-field optical nanotomography: a new method of multiparametric 3D investigation of nanostructural materials

被引:0
|
作者
A. E. Efimov
A. Yu. Bobrovsky
I. I. Agapov
O. I. Agapova
V. A. Oleinikov
I. R. Nabiev
K. E. Mochalov
机构
[1] Ministry of Public Health of the Russian Federation,Shumakov Federal Research Center of Transplantology and Artificial Organs
[2] SNOTRA Company,Shemyakin–Ovchinnikov Institute of Bioorganic Chemistry
[3] Moscow State University,Laboratory of Research in Nanosciences
[4] National Research Nuclear University Moscow Engineering Physics Institute (MEPhI),undefined
[5] Russian Academy of Sciences,undefined
[6] Université de Reims Champagne-Ardenne,undefined
来源
Technical Physics Letters | 2016年 / 42卷
关键词
Technical Physic Letter; Correlation Microscopy; Cantilever Probe; Nanoscale Resolution; Hybrid Nanostructural Material;
D O I
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学科分类号
摘要
A new experimental approach to multiparametric three-dimensional (3D) investigation of a broad class of composite nanostructural materials is developed on the basis of scanning near-field optical nanotomography (SNONT). Using this method, it is possible to simultaneously study the optical properties, 3D morphology, and distribution of the mechanical and electrical properties of the same region of a sample. The proposed method combines features of the confocal and near-field optical microspectroscopy (fluorescence and Raman spectroscopy) with a lateral resolution of up to 50 nm and scanning-probe microscopy. The possibility of studying the volume distribution of optical, morphological, electrical, and mechanical characteristics of a material with nanoscale resolution is related to the probing of sequential layers at a step of up to 20 nm and a total Z-scan depth of up to 3 mm. In particular, the SNONT method has been used to study a liquid-crystalline polymer doped with fluorescent nanocrystals.
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页码:171 / 174
页数:3
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