共 50 条
- [46] Assembly and application specific methodology to determine accelerated temperature cycling requirements for Pb-free solder joint reliability 57TH ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE, 2007 PROCEEDINGS, 2007, : 124 - 128
- [47] Effects of UBM thickness in electromigration on Pb-free solder joints 54TH ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE, VOLS 1 AND 2, PROCEEDINGS, 2004, : 998 - 1002
- [48] Effects of electromigration on IMC evolution in Pb-free solder joints 2004 INTERNATIONAL CONFERENCE ON THE BUSINESS OF ELECTRONIC PRODUCT RELIABILITY AND LIABILITY, PROCEEDINGS, 2004, : 47 - 49
- [50] Reliability of the Pb-free solder bump on electroless Ni under bump metallurgies 53RD ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE, 2003 PROCEEDINGS, 2003, : 77 - 82