The effect of irradiation with high-energy protons on 4H-SiC detectors

被引:0
|
作者
V. Kažukauskas
R. Jasiulionis
V. Kalendra
J. -V. Vaitkus
机构
[1] Vilnius University,Semiconductor Physics Department and Institute of Materials Science and Applied Research
[2] Institute of Physics,undefined
来源
Semiconductors | 2007年 / 41卷
关键词
61.80.Jh; 72.80.Jc; 85.30.De;
D O I
暂无
中图分类号
学科分类号
摘要
The effect of irradiation of 4H-SiC ionizing-radiation detectors with various doses (as high as 1016 cm−2) of 24-GeV protons is studied. Isotopes of B, Be, Li, He, and H were produced in the nuclear spallation reactions of protons with carbon. Isotopes of Al, Mg, Na, Ne, F, O, and N were produced in the reactions of protons with silicon. The total amount of the produced stable isotopes varied in proportion with the radiation dose from 1.2 × 1011 to 5.9 × 1013 cm−2. It is shown that, at high radiation doses, the contact characteristics of the detectors change appreciably. The potential-barrier height increased from the initial value of 0.7–0.75 eV to 0.85 eV; the rectifying characteristics of the Schottky contacts deteriorated appreciably. These effects are attributed to the formation of a disordered structure of the material as a result of irradiation.
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页码:345 / 352
页数:7
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