High-speed integrated nanowire circuits

被引:0
|
作者
Robin S. Friedman
Michael C. McAlpine
David S. Ricketts
Donhee Ham
Charles M. Lieber
机构
[1] Harvard University,Department of Chemistry and Chemical Biology
[2] Harvard University,Division of Engineering and Applied Sciences
来源
Nature | 2005年 / 434卷
关键词
D O I
暂无
中图分类号
学科分类号
摘要
Inexpensive sophisticated circuitry can be ‘painted’ on to plastic or glass substrates.
引用
收藏
页码:1085 / 1085
相关论文
共 50 条
  • [21] HIGH-SPEED BIPOLAR INTEGRATED-CIRCUITS FOR SSC APPLICATIONS
    NEWCOMER, FM
    VANBERG, R
    VANDERSPIEGEL, J
    WILLIAMS, HH
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1989, 283 (03): : 806 - 809
  • [22] HIGH-SPEED SCALING DECADE BASED ON INTEGRATED-CIRCUITS
    PERELMAN, AA
    [J]. INSTRUMENTS AND EXPERIMENTAL TECHNIQUES-USSR, 1971, 14 (05): : 1381 - &
  • [23] ELECTROOPTIC SAMPLING OF HIGH-SPEED DEVICES AND INTEGRATED-CIRCUITS
    WIESENFELD, JM
    [J]. IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1990, 34 (2-3) : 141 - 161
  • [24] ISOLATION TECHNIQUE FOR HIGH-SPEED BIPOLAR INTEGRATED-CIRCUITS
    NAKAJIMA, S
    KATO, K
    [J]. REVIEW OF THE ELECTRICAL COMMUNICATIONS LABORATORIES, 1977, 25 (9-10): : 1039 - 1051
  • [25] HIGH-SPEED COMMUNICATIONS CIRCUITS
    WILLIAMS, J
    [J]. EDN, 1991, 36 (23) : 233 - 241
  • [26] HIGH-SPEED GALLIUM-ARSENIDE FOR DIGITAL INTEGRATED-CIRCUITS
    MERRETT, RP
    [J]. ELECTRONICS AND POWER, 1987, 33 (04): : 241 - 244
  • [27] A STOCHASTIC ALGORITHM FOR HIGH-SPEED CAPACITANCE EXTRACTION IN INTEGRATED-CIRCUITS
    LECOZ, YL
    IVERSON, RB
    [J]. SOLID-STATE ELECTRONICS, 1992, 35 (07) : 1005 - 1012
  • [28] HIGH-SPEED AND WIDE-BAND ANALOG INTEGRATED-CIRCUITS
    AGAKHANYAN, TM
    [J]. SOVIET MICROELECTRONICS, 1986, 15 (02): : 71 - 74
  • [29] High-speed photodiodes for InP-based photonic integrated circuits
    Rouvalis, E.
    Chtioui, M.
    Tran, M.
    Lelarge, F.
    van Dijk, F.
    Fice, M. J.
    Renaud, C. C.
    Carpintero, G.
    Seeds, A. J.
    [J]. OPTICS EXPRESS, 2012, 20 (08): : 9172 - 9177
  • [30] PICOSECOND PHOTOELECTRON MICROSCOPE FOR HIGH-SPEED TESTING OF INTEGRATED-CIRCUITS
    MAY, P
    PASTOL, Y
    HALBOUT, JM
    CHIU, G
    [J]. IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1990, 34 (2-3) : 204 - 214